Industrial X-Ray Computed Tomography
"Simone Carmignato, Wim Dewulf, Richard Leach"
Industrial X-Ray Computed Tomography - Springer 2018
978-3-319-59573-3
"Materials Science; Characterization and Evaluation of Materials; Optical and Electronic Materials; Atomic, Molecular, Optical and Plasma Physics"
Industrial X-Ray Computed Tomography - Springer 2018
978-3-319-59573-3
"Materials Science; Characterization and Evaluation of Materials; Optical and Electronic Materials; Atomic, Molecular, Optical and Plasma Physics"