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Radiation-induced Soft Error: A Chip-level Modeling

Seifert

Radiation-induced Soft Error: A Chip-level Modeling - IEEE

ISBN: 9781601983947

Subjects--Topical Terms:
"Components, Circuits, Devices and Systems; Computing and Processing; Engineered Materials, Dielectrics and Plasmas"

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Radiation-induced Soft Error: A Chip-level Modeling

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