Course reserves for VLSI Design For Testability
- Department: Electronics
- Course number: ECE 4012
- Instructors:
| Title | Author | Item type | Location | Collection | Call number | Copy number | Status | Date due | Notes | Link | |
|---|---|---|---|---|---|---|---|---|---|---|---|
| Digital Systems Testing and Testable Design / | Abramovici, Miron | Text Book | VIT-AP General Stacks |
621.3815 ABR | Available | ECE | Record URL | ||||
| Essentials of Electronic Testing for Digital, Memory, and Mixed-Signal VLSI Circuits / | Bushnell, Michael L. | Text Book | VIT-AP General Stacks |
621.395 BUS | Available | ECE | Record URL | ||||
| Modern Digital Electronics / | Jain, R P | Text Book | School of Electronics Section General Stacks |
621.381 JAI | In transit from VIT-AP to School of Electronics Section since 2024-03-28 | ECE | Record URL |