Course reserves for Testing Of VLSI Circuits
- Department: Electronics
- Course number: ECE6004
- Instructors:
Title | Author | Item type | Location | Collection | Call number | Copy number | Status | Date due | Notes | Link | |
---|---|---|---|---|---|---|---|---|---|---|---|
Digital Systems Testing and Testable Design / | Abramovici, Miron | Text Book | VIT-AP General Stacks |
621.3815 ABR | Available | ECE | Record URL | ||||
Essentials of Electronic Testing for Digital, Memory, and Mixed-Signal VLSI Circuits / | Bushnell, Michael L. | Text Book | VIT-AP General Stacks |
621.395 BUS | Available | ECE | Record URL | ||||
Modern Digital Electronics / | Jain, R P | Text Book | VIT-AP General Stacks |
621.381 JAI | Checked out to John Pradeep (70007) | 2021-09-01 | ECE | Record URL |