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ASIC/SoC Functional Design Verification : A Comprehensive Guide to Technologies and Methodologies / Ashok B. Meheta

By: Material type: TextTextPublication details: Netherland Springer International Publishing AG 2018Description: xxxi, 328p. : ill. ; 24cmISBN:
  • 9783319594170
Subject(s): DDC classification:
  • 23rd 621.3815 MEH
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Holdings
Item type Current library Call number Status Notes Date due Barcode Course reserves
Text Book VIT-AP General Stacks 621.3815 MEH (Browse shelf(Opens below)) Checked out to NIROJ KUMAR PATRA (24MVD7017) ECE 2025-05-14 019202

VLSI Verification Methodologies

Text Book VIT-AP General Stacks 621.3815 MEH (Browse shelf(Opens below)) In transit from VIT-AP to School of Electronics Section since 2025-05-04 ECE 019203
Text Book VIT-AP General Stacks 621.3815 MEH (Browse shelf(Opens below)) In transit from VIT-AP to School of Electronics Section since 2025-03-25 ECE 019204
Text Book VIT-AP General Stacks 621.3815 MEH (Browse shelf(Opens below)) In transit from VIT-AP to School of Electronics Section since 2025-04-09 ECE 019205
Text Book VIT-AP General Stacks 621.3815 MEH (Browse shelf(Opens below)) In transit from VIT-AP to School of Electronics Section since 2025-03-12 ECE 019206
Text Book VIT-AP General Stacks 621.3815 MEH (Browse shelf(Opens below)) Checked out to P Siva Ramakrishna (70422) ECE 2025-07-08 019207
Text Book VIT-AP General Stacks 621.3815 MEH (Browse shelf(Opens below)) In transit from VIT-AP to School of Electronics Section since 2025-04-21 ECE 019208
Text Book VIT-AP General Stacks 621.3815 MEH (Browse shelf(Opens below)) In transit from VIT-AP to School of Electronics Section since 2025-04-22 ECE 019209
Text Book VIT-AP General Stacks 621.3815 MEH (Browse shelf(Opens below)) Checked out to V RISHI SUDHAMSHU (24MVD7015) ECE 2025-05-10 019210
Reference Book VIT-AP General Stacks 621.3815 MEH (Browse shelf(Opens below)) Not For Loan (Restricted Access) ECE 019009

It includes bibliography and index pages

Introduction
This book describes in detail all required technologies and methodologies needed to create a comprehensive, functional design verification strategy and environment to tackle the toughest job of guaranteeing first-pass working silicon The author outlines all of the verification sub-fields at a high level, with just enough depth to allow a manager/decision maker or an engineer to grasp the field which can then be pursued in detail with the provided references. He describes in detail industry standard technologies such as UVM (Universal Verification Methodology), SVA (SystemVerilog Assertions), SFC (SystemVerilog Functional Coverage), CDV (Coverage Driven Verification), Low Power Verification (Unified Power Format UPF), AMS (Analog Mixed Signal) verification, Virtual Platform TLM2.0/ESL (Electronic System Level) methodology, Static Formal Verification, Logic Equivalency Check (LEC), Hardware Acceleration, Hardware Emulation, Hardware/Software Co-verification, Power Performance Area (PPA) analysis on a virtual platform, Reuse Methodology from Algorithm/ESL to RTL, and other overall methodologies.
Keywords
System-on-Chip design System-on-Chip verification Functional hardware verification SystemVerilog Assertions SystemVerilog Functional Coverage Assertion Based Verifiction

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