Simulation, Modeling, and Reliability Analysis of Line Tunneling Based Gate-All-Around TFETs: Applications in RF Circuits and Biosensing / Kadava R.N. Karthik

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TextPublication details: Amaravathi VIT-AP University 2024Description: xx, 154p. ill. ; 30cmSubject(s):

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Item type	Current library	Collection	Call number	Status	Notes	Date due	Barcode
Thesis	VIT-AP Reference	Reference	621.3815 KAR (Browse shelf(Opens below))	Not for loan	ECE		TH107

It includes Abstract, Acknowledgement, Table of Contents, List of Figures, List of Tables, List of Terms and Abbreviations, and Chapters etc.

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