TY  - BOOK
AU  - Abramovici, Miron
AU  - Friedman, Arthur D.
TI  - Digital Systems Testing and Testable Design
SN  - 9788172248918
U1  - 621.3815 ABR 23rd
PY  - 2014///
CY  - Mumbai
PB  - Jaico Publishing House
KW  - Breuer, Melvin A.
KW  - Digital integrated circuits--Design and construction; Digital integrated circuits—Testing
N1  - It includes index pages
UR  - http://www.jaicobooks.com/j/j_searchtry.asp?selcat=title&keyword=Digital+Systems+Testing+and+Testable+Design
ER  -