TY  - BOOK
AU  - "Juan Pablo Borja, Toh-Ming Lu, Joel Plawsky"
TI  - Dielectric Breakdown in Gigascale Electronics
SN  - 978-3-319-43220-5
PB  - Springer
KW  - Materials Science; Optical and Electronic Materials; Nanotechnology and Microengineering; Electronic Circuits and Devices; Nanotechnology
UR  - http://link.springer.com/openurl?genre=book&isbn=978-3-319-43220-5
ER  -