"Simone Carmignato, Wim Dewulf, Richard Leach" <br/><br/>
Industrial X-Ray Computed Tomography 

 -  Springer  2018 
<br/><br/><label>ISBN: </label>978-3-319-59573-3 
<br/><br/><label>Subjects--Topical Terms: </label><br/>"Materials Science; Characterization and Evaluation of Materials; Optical and Electronic Materials; Atomic, Molecular, Optical and Plasma Physics"