"Nicolas Brodusch, Hendrix Demers, Raynald Gauvin" <br/><br/>
Field Emission Scanning Electron Microscopy 

 -  Springer  2018 
<br/><br/><label>ISBN: </label>978-981-10-4433-5 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Materials Science; Characterization and Evaluation of Materials; Spectroscopy and Microscopy; Nanotechnology and Microengineering