TY  - BOOK
AU  - "Nicolas Brodusch, Hendrix Demers, Raynald Gauvin"
TI  - Field Emission Scanning Electron Microscopy
SN  - 978-981-10-4433-5
PB  - Springer
KW  - Materials Science; Characterization and Evaluation of Materials; Spectroscopy and Microscopy; Nanotechnology and Microengineering
UR  - http://link.springer.com/openurl?genre=book&isbn=978-981-10-4433-5
ER  -