TY  - BOOK
AU  -  The Surface Science Society of Japan
TI  - Compendium of Surface and Interface Analysis
SN  - 978-981-10-6156-1
PB  - Springer
KW  - "Materials Science; Characterization and Evaluation of Materials; Spectroscopy/Spectrometry; Spectroscopy and Microscopy; Surface and Interface Science, Thin Films; Surfaces and Interfaces, Thin Films"
UR  - http://link.springer.com/openurl?genre=book&isbn=978-981-10-6156-1
ER  -