Souvik Mahapatra <br/><br/>
Fundamentals of Bias Temperature Instability in MOS Transistors 

 -  Springer  2016 
<br/><br/><label>ISBN: </label>978-81-322-2508-9 
<br/><br/><label>Subjects--Topical Terms: </label><br/>"Engineering; Circuits and Systems; Electronics and Microelectronics, Instrumentation; Solid State Physics"