TY  - BOOK
AU  - Souvik Mahapatra
TI  - Fundamentals of Bias Temperature Instability in MOS Transistors
SN  - 978-81-322-2508-9
PB  - Springer
KW  - "Engineering; Circuits and Systems; Electronics and Microelectronics, Instrumentation; Solid State Physics"
UR  - http://link.springer.com/openurl?genre=book&isbn=978-81-322-2508-9
ER  -