TY  - BOOK
AU  - Jiann-Shiun Yuan
TI  - CMOS RF Circuit Design for Reliability and Variability
SN  - 978-981-10-0884-9
PB  - Springer
KW  - "Engineering; Circuits and Systems; Electronic Circuits and Devices; Microwaves, RF and Optical Engineering"
UR  - http://link.springer.com/openurl?genre=book&isbn=978-981-10-0884-9
ER  -