TY  - BOOK
AU  - "Yung-Chun Wu, Yi-Ruei Jhan"
TI  - 3D TCAD Simulation for CMOS Nanoeletronic Devices
SN  - 978-981-10-3066-6
PB  - Springer
KW  - "Engineering; Electronics and Microelectronics, Instrumentation; Semiconductors; Nanotechnology and Microengineering; Industrial and Production Engineering"
UR  - http://link.springer.com/openurl?genre=book&isbn=978-981-10-3066-6
ER  -