Selahattin Sayil <br/><br/>
Contactless VLSI Measurement and Testing Techniques 

 -  Springer  2018 
<br/><br/><label>ISBN: </label>978-3-319-69673-7 
<br/><br/><label>Subjects--Topical Terms: </label><br/>"Engineering; Circuits and Systems; Processor Architectures; Electronics and Microelectronics, Instrumentation"