TY  - BOOK
AU  - Selahattin Sayil
TI  - Contactless VLSI Measurement and Testing Techniques
SN  - 978-3-319-69673-7
PB  - Springer
KW  - "Engineering; Circuits and Systems; Processor Architectures; Electronics and Microelectronics, Instrumentation"
UR  - http://link.springer.com/openurl?genre=book&isbn=978-3-319-69673-7
ER  -