Design and Analysis of Radiation Hardened SRAM Cell for Space Applications - Pavan Kumar, Mukku; Rohit Lorenzo (Amaravathi VIT-AP University, 2024)
It includes Abstract, Acknowledgement, Table of Contents, List of Figures, List of Tables, List of Terms and Abbreviations, and Chapters etc.
Keywords: Critical Charge; Error Correction Code (ECC); Process; Voltage and Temperature Analysis; Sensitive Nodes; Soft Errors; Single Event Upset (SEU)