TY  - BOOK
AU  - Pavan Kumar, Mukku
AU  - Rohit Lorenzo
TI  - Design and Analysis of Radiation Hardened SRAM Cell for Space Applications
U1  - 629.471 PAV 23rd Ed.
PY  - 2024///
CY  - Amaravathi
PB  - VIT-AP University
KW  - Critical Charge; Error Correction Code (ECC); Process; Voltage and Temperature Analysis; Sensitive Nodes; Soft Errors; Single Event Upset (SEU)
N1  - It includes Abstract, Acknowledgement, Table of Contents, List of Figures, List of Tables, List of Terms and Abbreviations, and Chapters etc.
UR  - https://shodhganga.inflibnet.ac.in/handle/10603/562654
ER  -