Simulation, Modeling, and Reliability Analysis of Line Tunneling Based Gate-All-Around TFETs: Applications in RF Circuits and Biosensing - Karthik, Kadava R.N.; Chandan Kumar Pandey (Amaravathi VIT-AP University, 2024)
It includes Abstract, Acknowledgement, Table of Contents, List of Figures, List of Tables, List of Terms and Abbreviations, and Chapters etc.
Keywords: BTBT; Dielectric Materials; GAA; ITCs; SS; VTFET