TY  - BOOK
AU  - Karthik, Kadava R.N.
AU  - Chandan Kumar Pandey
TI  - Simulation, Modeling, and Reliability Analysis of Line  Tunneling Based Gate-All-Around TFETs: Applications  in RF Circuits and Biosensing
U1  - 621.3815 KAR 
PY  - 2024///
CY  - Amaravathi
PB  - VIT-AP University
KW  - BTBT; Dielectric Materials; GAA; ITCs; SS; VTFET
N1  - It includes Abstract, Acknowledgement, Table of Contents, List of Figures, List of Tables, List of Terms and Abbreviations, and Chapters etc.
ER  -