| 000 | 00573nam a2200145Ia 4500 | ||
|---|---|---|---|
| 008 | 210311s9999 xx 000 0 und d | ||
| 020 | _a978-3-319-59573-3 | ||
| 100 | _a"Simone Carmignato, Wim Dewulf, Richard Leach" | ||
| 245 | 0 | _aIndustrial X-Ray Computed Tomography | |
| 260 | _bSpringer | ||
| 260 | _c2018 | ||
| 650 | _a"Materials Science; Characterization and Evaluation of Materials; Optical and Electronic Materials; Atomic, Molecular, Optical and Plasma Physics" | ||
| 856 | _uhttp://link.springer.com/openurl?genre=book&isbn=978-3-319-59573-3 | ||
| 942 | _cEBOOK | ||
| 999 |
_c35080 _d35080 |
||