| 000 | 00567nam a2200145Ia 4500 | ||
|---|---|---|---|
| 008 | 210311s9999 xx 000 0 und d | ||
| 020 | _a978-981-10-4433-5 | ||
| 100 | _a"Nicolas Brodusch, Hendrix Demers, Raynald Gauvin" | ||
| 245 | 0 | _aField Emission Scanning Electron Microscopy | |
| 260 | _bSpringer | ||
| 260 | _c2018 | ||
| 650 | _aMaterials Science; Characterization and Evaluation of Materials; Spectroscopy and Microscopy; Nanotechnology and Microengineering | ||
| 856 | _uhttp://link.springer.com/openurl?genre=book&isbn=978-981-10-4433-5 | ||
| 942 | _cEBOOK | ||
| 999 |
_c35110 _d35110 |
||