000 00531nam a2200145Ia 4500
008 210311s9999 xx 000 0 und d
020 _a978-81-322-2508-9
100 _aSouvik Mahapatra
245 0 _aFundamentals of Bias Temperature Instability in MOS Transistors
260 _bSpringer
260 _c2016
650 _a"Engineering; Circuits and Systems; Electronics and Microelectronics, Instrumentation; Solid State Physics"
856 _uhttp://link.springer.com/openurl?genre=book&isbn=978-81-322-2508-9
942 _cEBOOK
999 _c36010
_d36010