000 00408nam a2200133Ia 4500
008 210311s9999 xx 000 0 und d
020 _a9780471749097
100 _aSchroder
245 0 _aSemiconductor Material and Device Characterization
260 _bIEEE
650 _a"Components, Circuits, Devices and Systems"
856 _uhttps://ieeexplore.ieee.org/servlet/opac?bknumber=5237928
942 _cEBOOK
999 _c40932
_d40932