Course reserves for Testing Of VLSI Circuits

  1. Department: Electronics
  2. Course number: ECE6004
  3. Instructors:
Title Author Item type Location Collection Call number Copy number Status Date due Notes Link
Digital Systems Testing and Testable Design / Abramovici, Miron Text Book VIT-AP
General Stacks
621.3815 ABR Available ECE Record URL
Essentials of Electronic Testing for Digital, Memory, and Mixed-Signal VLSI Circuits / Bushnell, Michael L. Text Book VIT-AP
General Stacks
621.395 BUS Available ECE Record URL
Modern Digital Electronics / Jain, R P Text Book VIT-AP
General Stacks
621.381 JAI Checked out 2021-09-01 ECE Record URL

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