Doebelin's Measurement Systems / Ernest O Doebelin and Dhanesh N Manik
By: Doebelin, Ernest O
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Contributor(s): Manik, Dhanesh N.
Material type: 
TextPublisher: Chennai McGraw Hill Education (India) Private Ltd. 2018Edition: 6th Ed.Description: xx, 760p.ISBN: 9780070699687.Subject(s): Measuring instruments; Physical measurementsDDC classification: 681.2 DOE
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VIT-AP General Stacks | 681.2 DOE (Browse shelf) | Available | MECH | 014723 | |||
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VIT-AP General Stacks | 681.2 DOE (Browse shelf) | Available | MECH | 014724 | |||
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VIT-AP General Stacks | 681.2 DOE (Browse shelf) | Available | MECH | 014132 | |||
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VIT-AP General Stacks | 681.2 DOE (Browse shelf) | Available | MECH | 014133 | |||
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VIT-AP General Stacks | 681.2 DOE (Browse shelf) | Available | MECH | 014134 | |||
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VIT-AP General Stacks | 681.2 DOE (Browse shelf) | Available | MECH | 014135 | |||
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School of Mechanical Engg Section General Stacks | 681.2 DOE (Browse shelf) | In transit from VIT-AP to School of Mechanical Engg Section since 2024-02-21 | MECH | 014136 | |||
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VIT-AP General Stacks | 681.2 DOE (Browse shelf) | Available | MECH | 014137 | |||
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VIT-AP General Stacks | 681.2 DOE (Browse shelf) | Available | MECH | 014138 | |||
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VIT-AP General Stacks | 681.2 DOE (Browse shelf) | Available | MECH | 014139 | |||
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VIT-AP General Stacks | 681.2 DOE (Browse shelf) | Available | MECH | 014140 | |||
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VIT-AP General Stacks | 681.2 DOE (Browse shelf) | Available | MECH | 014141 | |||
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VIT-AP General Stacks | 681.2 DOE (Browse shelf) | Available | MECH | 014142 | |||
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VIT-AP General Stacks | 681.2 DOE (Browse shelf) | Available | MECH | 014143 | |||
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VIT-AP General Stacks | 681.2 DOE (Browse shelf) | Available | MECH | 014144 | |||
Reference Book
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VIT-AP General Stacks | Reference | 681.2 DOE (Browse shelf) | Not for loan | MECH | 012723 | ||
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VIT-AP General Stacks | Reference | 681.2 DOE (Browse shelf) | Not for loan | MECH | 012385 |
It includes index.
This is a well known text on Measurement and Instrumentationwhere due diligence has been taken to explain each and every topicwith the help of theoretical, schematic and numerical explanations.Stress is laid on both solved and unsolved examples for bettercoverage and depth.
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