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Digital Systems Testing and Testable Design / Miron Abramovici, Melvin A. Breuer and Arthur D. Friedman

By: Abramovici, Miron.
Contributor(s): Friedman, Arthur D.
Material type: TextTextPublisher: Mumbai Jaico Publishing House 2014Description: xviii, 652p. : ill. ; 25cm.ISBN: 9788172248918.Subject(s): Breuer, Melvin A | Digital integrated circuits--Design and construction; Digital integrated circuits—TestingDDC classification: 621.3815 ABR Online resources: Click here to access online
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Reference Book Reference Book VIT-AP
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Reference 621.3815 ABR (Browse shelf) Not for loan ECE 018593
 Text Book Text Book VIT-AP
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621.3815 ABR (Browse shelf) Available ECE 018594

VLSI Design For Testability

 Text Book Text Book VIT-AP
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621.3815 ABR (Browse shelf) Available ECE 018595

Testing Of VLSI Circuits

 Text Book Text Book VIT-AP
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621.3815 ABR (Browse shelf) Available ECE 018596
 Text Book Text Book VIT-AP
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621.3815 ABR (Browse shelf) Available ECE 018597
 Text Book Text Book VIT-AP
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621.3815 ABR (Browse shelf) Available ECE 018598
 Text Book Text Book VIT-AP
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621.3815 ABR (Browse shelf) Available ECE 018599
 Text Book Text Book VIT-AP
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621.3815 ABR (Browse shelf) Available ECE 018600
 Text Book Text Book VIT-AP
General Stacks
621.3815 ABR (Browse shelf) Available ECE 018601
 Text Book Text Book VIT-AP
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621.3815 ABR (Browse shelf) Available ECE 018602

It includes index pages

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