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Essentials of Electronic Testing for Digital, Memory, and Mixed-Signal VLSI Circuits / Michael L. Bushnell and Vishwani D. Agrawal

By: Bushnell, Michael L.
Contributor(s): Agrawal, Vishwani D.
Material type: TextTextPublisher: New Delhi Springer (India) Pvt. Ltd. 2015Description: xviii, 690p. : ill. ; 24cm.ISBN: 9788132233299.Subject(s): Mixed signal circuits—Testing; Semiconductor storage devices—Testing; Digital integrated circuits—Testing; Integrated circuits--Very large scale integration—Testing; Computer engineering; Computer-aided design; Systems engineering; ElectronicsDDC classification: 621.395 BUS Online resources: Click here to access online
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Reference 621.395 BUS (Browse shelf) Not For Loan ECE 019020
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621.395 BUS (Browse shelf) Available ECE 019021

VLSI Design For Testability

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621.395 BUS (Browse shelf) Available ECE 019022

Testing Of VLSI Circuits

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621.395 BUS (Browse shelf) Available ECE 019023
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It includes bibliography and index

The modern electronic testing has a forty year history. Test professionals hold some fairly large conferences and numerous workshops, have a journal, and there are over one hundred books on testing. Still, a full course on testing is offered only at a few universities, mostly by professors who have a research interest in this area. Apparently, most professors would not have taken a course on electronic testing when they were students. Other than the computer engineering curriculum being too crowded, the major reason cited for the absence of a course on electronic testing is the lack of a suitable textbook. For VLSI the foundation was provided by semiconductor device techn- ogy, circuit design, and electronic testing. In a computer engineering curriculum, therefore, it is necessary that foundations should be taught before applications. The field of VLSI has expanded to systems-on-a-chip, which include digital, memory, and mixed-signalsubsystems. To our knowledge this is the first textbook to cover all three types of electronic circuits. We have written this textbook for an undergraduate “foundations” course on electronic testing. Obviously, it is too voluminous for a one-semester course and a teacher will have to select from the topics. We did not restrict such freedom because the selection may depend upon the individual expertise and interests. Besides, there is merit in having a larger book that will retain its usefulness for the owner even after the completion of the course. With equal tenacity, we address the needs of three other groups of readers.

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