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Digital Systems Testing and Testable Design / Miron Abramovici, Melvin A. Breuer and Arthur D. Friedman

By: Contributor(s): Material type: TextTextPublication details: Mumbai Jaico Publishing House 2014Description: xviii, 652p. : ill. ; 25cmISBN:
  • 9788172248918
Subject(s): DDC classification:
  • 23rd 621.3815 ABR
Online resources:
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Holdings
Item type Current library Collection Call number Status Notes Date due Barcode Course reserves
Reference Book VIT-AP General Stacks Reference 621.3815 ABR (Browse shelf(Opens below)) Not for loan ECE 018593
Text Book VIT-AP General Stacks 621.3815 ABR (Browse shelf(Opens below)) Available ECE 018594

VLSI Design For Testability

Text Book VIT-AP General Stacks 621.3815 ABR (Browse shelf(Opens below)) Available ECE 018595

Testing Of VLSI Circuits

Text Book VIT-AP General Stacks 621.3815 ABR (Browse shelf(Opens below)) Available ECE 018596
Text Book VIT-AP General Stacks 621.3815 ABR (Browse shelf(Opens below)) Available ECE 018597
Text Book VIT-AP General Stacks 621.3815 ABR (Browse shelf(Opens below)) In transit from VIT-AP to School of Electronics Section since 2025-01-30 ECE 018598
Text Book VIT-AP General Stacks 621.3815 ABR (Browse shelf(Opens below)) Available ECE 018599
Text Book VIT-AP General Stacks 621.3815 ABR (Browse shelf(Opens below)) Available ECE 018600
Text Book VIT-AP General Stacks 621.3815 ABR (Browse shelf(Opens below)) Available ECE 018601
Text Book VIT-AP General Stacks 621.3815 ABR (Browse shelf(Opens below)) Available ECE 018602

It includes index pages

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